一种预测界面裂纹形成的新方法

A New Approach to Predicting Interfacial Crack Growth

1.
Department of Mechanical, Aerospace and Manufacturing Engineering, Syracuse University, Syracuse, NY 13244, U.S.A.;
2.
Chongqing Jiaotong Institute, Chongqing 630074, P. R. China

摘要: 本文提出了一种预测界面裂纹形成的新方法,称为“β=0法”.这是一种变换方法,通过调整有关材料弹性常数,把振荡应力场变换为非振荡应力场.界面韧性曲线将随调整后新的材料性质而改变.本文方法预测的临界荷载与界面断裂力学预测的临界荷载严格一致.最后通过几个实例说明了保持能量释放率不变的情况下,怎样实施β=0法.
- 界面裂纹 /
- 裂纹形成 /
- β=0法 /
- 临界荷载
Abstract: A new approach, called "β=0 approach" is presented for use in the prediction of interfacial crack growth. This approach is a kind of transformation. It transforms an oscillatory stress field to a nonoscillatory case by adjusting the elastic constants of the materials involved. The interface toughness locus is also changed according to the new material properties. It is shown that this approach will predict the exact same critical load as interfacial fracture mechanics does. Finally several examples are presented to show how to enforce β=0 while keeping the energy release rate unchanged.
- interfacial crack /
- crack growth /
- β=0 approach /
- critical load

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