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升温和降温引起TATB基PBX炸药脱黏的数值分析

范正杰 刘占芳

范正杰, 刘占芳. 升温和降温引起TATB基PBX炸药脱黏的数值分析[J]. 应用数学和力学, 2020, 41(9): 956-973. doi: 10.21656/1000-0887.410062
引用本文: 范正杰, 刘占芳. 升温和降温引起TATB基PBX炸药脱黏的数值分析[J]. 应用数学和力学, 2020, 41(9): 956-973. doi: 10.21656/1000-0887.410062
FAN Zhengjie, LIU Zhanfang. Numerical Analysis on Debonding of Crystal-Binder Interface in TATB-Based Polymer-Bonded Explosive Caused by Heating and Cooling Processes[J]. Applied Mathematics and Mechanics, 2020, 41(9): 956-973. doi: 10.21656/1000-0887.410062
Citation: FAN Zhengjie, LIU Zhanfang. Numerical Analysis on Debonding of Crystal-Binder Interface in TATB-Based Polymer-Bonded Explosive Caused by Heating and Cooling Processes[J]. Applied Mathematics and Mechanics, 2020, 41(9): 956-973. doi: 10.21656/1000-0887.410062

升温和降温引起TATB基PBX炸药脱黏的数值分析

doi: 10.21656/1000-0887.410062
基金项目: 国家自然科学基金委员会与中国工程物理研究院联合基金(U1830115)
详细信息
    作者简介:

    范正杰(1993—),男,硕士生(E-mail: 547092985@qq.com);刘占芳(1963—),男,教授,博士生导师(通讯作者. E-mail: zhanfang@cqu.edu.cn).

  • 中图分类号: O34/TJ55

Numerical Analysis on Debonding of Crystal-Binder Interface in TATB-Based Polymer-Bonded Explosive Caused by Heating and Cooling Processes

Funds: The Joint Fund of the National Natural Science Foundation of China and the China Academy of Engineering Physics(U1830115)
  • 摘要: 高聚物黏结炸药(polymer-bonded explosive, PBX)是含能颗粒与黏结剂组成的、具有微结构的非均质材料.热力环境下,PBX出现损伤是由晶粒与黏结剂及其界面的力学性能导致的.基于Voronoi理论与Monte Carlo的级配思想,建立了五种晶粒体积分数的PBX二维几何模型.考虑温度变化对晶粒和黏结剂热力学特性的影响,引入双线性本构模型描述晶粒-黏结剂界面的力学性质.数值研究了升温和降温过程PBX界面损伤机理.结果表明,升温时主要由较大的界面切向应力使得界面出现脱黏,降温时界面上的法向拉应力是界面脱黏的主要因素.相较升温阶段,降温过程更易产生界面脱黏,符合实验观察的结果.随着炸药晶粒体积分数的增加,降温后界面的残余刚度更大,表明提高PBX晶粒体积分数有助于降低界面脱黏.当晶粒体积分数越相近时,各晶粒粒径越趋于一致,则在界面上的损伤程度就越小.
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出版历程
  • 收稿日期:  2019-12-11
  • 修回日期:  2020-01-11
  • 刊出日期:  2020-09-01

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